-- About SX XAFS Database --

This database contains 98 datasets (194 spectra) as of 2021/11/12.
★ Beamline : BL-2, BL-10, BL-11, BL-13
★ Mode

• TEY (Total Electron Yield) :
  All electrons emitted by a sample are measured by the sample current.
• PEY (Partial Electron Yield) :
  Electrons with higher kinetic energies than a specific energy are collected by applying a retarding voltage
• PFY (Partial Fluorescence Yield) :
  Specific X-ray fluorescence is measured with a detector such as SDD or SSD.
• IPFY (Inverse Partial Fluorescence Yield) :
  Spectrum of the target element is obtained by acquiring fluorescent X-rays of the coexisting element.
• TFY (Total Fluorescence Yield) :
  All photons from a sample are measured with a detector such as MCP.
• *Some data is distorted due to self-absorption (FY), charge-up (EY), etc. Please use with caution.
  

★ How to use

• (1) Enter a keyword ("SiO2", "BL-10" etc.) in search box.
  
• (2) Find the data. Click the measurement mode to display the thumbnail.
  
• (3) The data files can be downloaded in Zip format.
  
• Click here for details on the Zip file.
  

★ This work is licensed under a CC BY-NC-SA.

Please quote as in the example below.
[1] Ritsumeikan SR Center, "Ritsumeikan SR Center Soft X-Ray XAFS Database",
  http://www.ritsumei.ac.jp/acd/re/src/sx_xafs_db/ (2021).